Jiann Yuan is a Pegasus Professor at the UCF Department of Electrical and Computer Engineering. received his Ph.D. in electrical engineering from the University of Florida. He has been a faculty member at UCF since 1990, where he serves as the site director of the NSF I/UCRC MIST Center. He has published three books and more than 360 papers in journals and conference proceedings in the areas of semiconductor devices and circuits. At UCF he has supervised 32 Ph.D. dissertations and 35 M.S. theses. Yuan was an editor of IEEE Transactions on Device and Materials Reliability and is a distinguished lecturer for the IEEE Electron Devices Society. He served on the IEEE Florida Council and was the recipient of its 1993 Outstanding Engineering Educator Award. Yuan received the 1995, 2004, 2010, 2015 and 2020 teaching incentive program awards as well as the 2003 and 2018 research incentive awards from UCF. He was named a Pegasus Professor in 2016.

• J. S. Yuan, H. D. Yen, S. Y. Chen, R. L. Wang, G. W. Huang, Y. Z. Juang, C. H. Tu, W. K. Yeh, and J. Ma, “Experimental verification of RF stress effect on cascode class E PA performance and reliability,” IEEE Trans. Device and Materials Reliability, pp. 369-375, June 2012


• J. Steighner and J. S. Yuan, “The effect of SOA enhancement on device ruggedness under UIS for the LDMOSFET,” IEEE Trans. Device and Materials Reliability, pp. 254-262, June 2011


• Y. Liu and J. S. Yuan, “CMOS RF power amplifier variability and reliability resilient biasing design and analysis,” IEEE Trans. Electron Devices, pp. 540-546, February 2011


• Y. Liu and J. S. Yuan, “CMOS RF low-noise amplifier design for variability and reliability,” IEEE Trans. Device and Materials Reliability, pp. 450-457, September 2011


• Y. T. Chen, K. M. Chen, W. K. Yeh, J. S. Yuan, and F. S. Yeh, “Impact of SOI thickness on FUSI-gate CESL CMOS performance and reliability,” IEEE Trans. Device and Materials Reliability, pp. 44-49, March 2011